Characterization of Semiconductor Materials - Principles...

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Characterization of Semiconductor Materials - Principles and Methods, Volume 1

Name: Characterization of Semiconductor Materials - Principles and Methods, Volume 1
ISBN: 9780815516347

McGuire, G.E.(eds.)

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Characterization of semiconductor materials and methods used to characterize them will be described extensively in this new Noyes series. Written by experts in each subject area, the series will present the most up-to-date information available in this rapidly advancing field. Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, Ion/Solid Interactions and more.

Thể loại:

Engineering

Năm:

1989

Nhà xuát bản:

William Andrew Publishing/Noyes

Ngôn ngữ:

english

Trang:

335

ISBN 10:

0815516347